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Standard IEC standard · IEC 60444-2:1980

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

Status: Valid

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Standard IEC standard · IEC 60444-2:1980

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
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Scope
Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.

Subjects

Piezoelectric devices (31.140)

Buy this standard

Standard IEC standard · IEC 60444-2:1980

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Subscribe on standards with our subscription service. When you use our service you can be assured the latest editions and easy access. Read more about SIS Subscriptions
Subscribe on standards - Read more Dölj
Price: 520 SEK
standard ikon pdf

PDF

Price: 520 SEK
standard ikon

Paper

Show more Show less

Product information

Language: English French

Written by: IEC

International title:

Article no: STD-122059

Edition: 1

Approved: 1/1/1980

No of pages: 18