Standard IEC standard · IEC 60191-6-3:2000

Mechanical standardization of semiconductor devices - Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP)

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Standard IEC standard · IEC 60191-6-3:2000

Mechanical standardization of semiconductor devices - Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP)
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Omfattning
IEC 60191-6-3:2000 stipulates a method for quad flat packs (QFP) measuring dimensions which are classified into Form E.

Ämnesområden

Allmänt Halvledarkomponenter (31.080.01)


Köp denna standard

Standard IEC standard · IEC 60191-6-3:2000

Mechanical standardization of semiconductor devices - Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP)
Prenumerera på standarden - Läs mer Dölj
Pris: 1 495 SEK
standard ikon pdf

PDF

Pris: 1 495 SEK
standard ikon

Papper

Fler alternativ Färre alternativ

Produktinformation

Språk: Engelska

Framtagen av: IEC

Internationell titel: Mechanical standardization of semiconductor devices - Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP)

Artikelnummer: STD-550750

Utgåva: 1

Fastställd: 2000-09-29

Antal sidor: 17