Standard IEC standard · IEC 60444-2:1980

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

Status: Gällande

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Standard IEC standard · IEC 60444-2:1980

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
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Omfattning
Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.

Ämnesområden

Piezoelektriska komponenter (31.140)


Köp denna standard

Standard IEC standard · IEC 60444-2:1980

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Prenumerera på standarden - Läs mer Dölj
Pris: 520 SEK
standard ikon pdf

PDF

Pris: 520 SEK
standard ikon

Papper

Fler alternativ Färre alternativ

Produktinformation

Språk: Engelska Franska

Framtagen av: IEC

Internationell titel: Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

Artikelnummer: STD-122059

Utgåva: 1

Fastställd: 1980-01-01

Antal sidor: 18